SinceVision Showcases Advanced Imaging and Sensing Technologies at SPIE VISION TECH 2026

Final Day Highlights Live Demos in 3D Inspection and Scientific Imaging

San Francisco, USA — January 22, 2026 — SinceVision is presenting its latest imaging and sensing technologies this week at SPIE VISION TECH 2026, part of SPIE Photonics West, held at the Moscone Center in San Francisco. As the event enters its final day, visitors are invited to Booth 6709 to experience live demonstrations and product previews focused on high-accuracy measurement and scientific imaging.

SPIE Photonics West is one of the world’s most influential photonics events, bringing together researchers, engineers, and technology developers across optical sensing, imaging, and photonics. At this year’s exhibition, SinceVision is highlighting how its expanding sensor and camera portfolio supports both industrial inspection and scientific research with reliable, application-ready performance.

Live Demonstrations Focused on Precision Measurement

A key attraction at the SinceVision booth is a live demonstration of high-accuracy pin height detection using the SR9040 3D Laser Profiler. The system demonstrates micron-level measurement performance and fast scanning speed, addressing the growing demand for in-line 3D inspection in electronics manufacturing and advanced assembly environments.

According to Jack Li, Global Sales & Marketing Director at SinceVision, demand for accurate 3D metrology continues to rise across North America.

“Manufacturers in North America are moving toward tighter process control and higher production speeds,” said Li. “That shift is driving strong demand for in-line, high-accuracy 3D inspection. Our laser profiling technology is designed to deliver stable, repeatable data that engineers can rely on directly in production environments.”

Also featured is a live thickness measurement demo using the SCI04025 spectral confocal displacement sensor. The demonstration shows non-contact measurement of transparent materials, highlighting stable performance on reflective and curved surfaces. Spectral confocal sensing is increasingly used where traditional contact or vision-based methods struggle to maintain consistency.

New sCMOS Camera Preview Marks Expansion in Scientific Imaging

SPIE VISION TECH 2026 also marks the preview of a new back-illuminated sCMOS camera from SinceVision’s Solis Series. The new model is designed to improve low-light imaging performance while maintaining low noise and stable signal output, addressing the needs of scientific and research users.

Artur Wang, Product Manager at SinceVision, brings over 12 years of experience in scientific camera development and sees growing interest in sCMOS technology across research disciplines.

“Low-light scientific imaging is becoming more important across life sciences, physical research, and optical measurement,” said Wang. “By introducing back-illuminated sCMOS technology, we are expanding SinceVision’s presence in scientific imaging and providing researchers with tools that deliver higher sensitivity without sacrificing measurement stability.”

The new camera is aimed at applications such as biomedical imaging, optical analysis, and other research scenarios where signal quality directly impacts data accuracy.

Final Day Invitation

Throughout the exhibition, SinceVision’s engineering and application teams have been engaging with visitors to discuss measurement challenges, system integration, and imaging performance requirements. With live demos running throughout the final day, the booth offers a hands-on opportunity to evaluate technologies in real operating conditions.

As SPIE VISION TECH 2026 concludes, SinceVision invites attendees to visit the booth and connect with the team in person.

Visit us today at Booth 6709 to see live demonstrations of 3D laser profiling, spectral confocal sensing, and next-generation sCMOS imaging.

For demo/sample/sales inquiries, email us at [email protected]