STEMMER IMAGING USA Product

Dalsa Genie Nano-CXP Cameras

STEMMER IMAGING USA

Ideal for solar panel inspection, electronic manufacturing inspection, general machine vision, and semiconductor wafer inspection.

Image of Dalsa Genie Nano-CXP Cameras

Phase 1 offers Teledyne Dalsa Genie Nano camera series with a CXP interface, offering unprecedented speed and uncompromised image quality. Engineered to withstand challenging industrial environments, the Genie Nano-CXP series starts with industry-leading CMOS sensors from 16 to 67 megapixel resolution to deliver higher frame rates. Typically used in solar panel inspection, general machine vision applications, electronics manufacturing for inspection purposes, and semiconductor wafer inspection, Genie Nano-CXP series offers an unmatched feature set and robust built quality for wide operating temperatures.

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