CIS Corporation Product

VCC-SXCXP1SW can detect and inspect the invisible part of the object in the region of 400nm to 1700nm wavelength spectrum.

Model: VCC-SXCXP1SW (SWIR)

CIS Corporation

Image of VCC-SXCXP1SW can detect and inspect the invisible part of the object in the region of 400nm to 1700nm wavelength spectrum. [Merit of inspection under SWIR wavelength spectrum] ¦Materials and contents are clearly distinguishable according to water penetration ratio of the objects. ¦According to the type of liquid, light transmittance factor or light absorption factor are different so that the excess or deficiency of the content, and the existence of foreign substances in the content can be inspected. ¦Leaf veins and scratches of fruits can be clearly seen on the images so that it is suitable for agricultural products inspection to see freshness and shapes. VCC-SXCXP1SW is suitable and useful for various inspection applications such as wafer inspection, PCB inspection, food and medical inspection, agricultural products inspection, identification and classification, manufacturing process inspection, etc. [SPEC] VCC-SXCXP1SW (SWIR)
  • I/F: CXP3×1 lane
  • Sensor: SenSWIR IMX990
  • Sensor size: 1/2 type
  • Unit cell size: 5×5µm
  • Effective pixel number: 1296×1032
  • Frame rate: 134.73fps(8bit)?125.2fps(10bit)?71.52fps(12bit)
  • Lens mount: C mount
  • Dimensions: 65×65×65mm
  • Features: Global shutter, Connector:BNC, External trigger, ROI, H&V flip, Lighting trigger control, detection wavelength spectrum:400~1700nm, cost effective
?For further information on VCC-SXCXP1SW, please contact our Sales division.

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