News
Versatile SWIR T2SL Camera up to 2.35 µm
POSTED 02/18/2015
Benefits of extended SWIR
SWIR imaging in the shortwave-infrared spectrum (SWIR) at wavelengths up to 2.35 µm is of special interest for hyperspectral imaging or laser beam analysis. Hyperspectral imaging in the SWIR range opens a wealth of new sensing applications for measuring environmental parameters, in geology for mineral detection, in agriculture for monitoring the maturity of crops and the type of vegetation that is present or in any application where disaster monitoring is needed. This is as relevant for airborne as it is in any R&D lab environment. When it comes to laser beam profiling, good measurement linearity, resolution and stability in the range of 1.0 to 2.35 µm are indispensable, all supported by the Xeva-2.35-320 TE4 infrared camera.
Superior performance for reliable research
The new XEVA-2.35-320 TE4 digital camera delivers 14-bit images at high frame rates of 100 Hz, 350 Hz or higher in windowing mode. It consists of a 320 x 256 T2SL detector array with pixel pitch of 30 µm at a pixel operability ratio of > 99%.
The detector head is cooled with a four-stage thermo-electrical cooling element, operating down to 220K, and is integrated into one single compact housing with all control and communication electronics. Flexibility is always ensured by Xenics’ SWIR imaging products. Each camera is delivered with a graphical user interface Xeneth, offering direct access to various camera settings including exposure time and operating temperature. The camera allows for exposure times from 1 μs to more than 100 ms in high dynamic range mode (with TE4 cooling). Software tools include 2-point uniformity correction and bad pixel replacement. The camera head interfaces to a PC via CameraLink or USB2.0.
Vision in Life Sciences
This content is part of the Vision in Life Sciences curated collection. To learn more about Vision in Life Sciences, click here.